Department News

Professor Byeng Dong Youn’s Team Develops Technology for Visualizing Malfunctions in Rotating Machine Systems

Author
Admin
Date
2018-01-26
Views
723

Professor Byeng Dong Youn’s Team Develops Technology

for Visualizing Malfunctions in Rotating Machine Systems

<?xml:namespace prefix = "o" ns = "urn:schemas-microsoft-com:office:office" /> 

 

<?xml:namespace prefix = "v" ns = "urn:schemas-microsoft-com:vml" />

Diagram of the visualization technology for rotating machine system (Provided by SNU Engineering)

 

On January 22, 2018, Seoul National University’s College of Engineering (Dean: Kookheon Char) announced that Professor Byeng Dong Youn’s research team from Department of Mechanical and Aerospace Engineering has developed a technology that visualizes malfunctions in rotating machine systems.

 

Unlike the current malfunction assessment technology of the gear box, this technology generates a two-dimensional visualization of the measured signal, hence allowing for an immediate assessment of the cause of malfunction. It also leads to an accurate response, regardless of the noise produced.

 

With the advent of the Fourth Industrial Revolution, full automation of large-scale production lines and automatic management of power plant systems are becoming possible. However, experts agree that the current technology for malfunction assessment is inadequate. Even if we can observe the measurement data, environmental noise makes it difficult to diagnose the exact cause.

 

On the other hand, the newly developed visualization technology for signal-based malfunction assessment facilitates a precise response to malfunctions, and increases the efficiency of power plants and their equipments. Thus it is critical in minimizing financial and personnel loss.

 

Prof. Youn’s team commented that “the technology can visualize the signal of rotating systems in a variety of fields such as large-scale automated lines and power plants with large rotating equipments,” and that they “expect this technology to be effectively utilized in malfunction assessment and overall integrity management.”

 

This research has been published in IEEE Transactions on Industrial Electronics (TIE), a highly acclaimed journal in the field.

[Figure]

Professor Byeong Dong Youn, SNU Dept. of Mechanical and Aerospace Engineering
(Provided by SNU Engineering)


Related articles:
 - SNU Engineering News http://eng.snu.ac.kr/node/15367
 - Financial News http://www.fnnews.com/news/201801221915448245